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Insight

Description:

The quality imperative demanded in high-efficiency PV designs is to make exactly the same product, every single time, while consistently meeting the design specification. This means that understanding and controlling variations in production that affect the distribution of IV parameters is crucial. Achieving this requires identifying specific variation sources, quantifying their relative interactions and impact on IV results, and rapidly acting on this information. Process and production experts require the right tools to do this effectively across enormous and ever-growing sets of production data. Until now this type of sophisticated analysis has not generally been achievable. At the same time it is becoming critically important; especially so in high-efficiency cell designs with narrower process windows.

Aurora Insight solves this dilemma by providing a comprehensive set of analytical tools that go beyond traditional Statistical Process Control methods to allow process and production personnel to see and understand tradeoffs and variations in material and process-influenced recombination, resistivity and other cell parameters as they occur during production. It also provides the means to detect and correct process deviations or faults that cannot be discerned at the end-of-line cell tester, but can cause protracted declines in average efficiency or costly quality issues in the field. 

Using data available directly from cell testers, inline or standalone measurement systems, or an MES, Aurora Insight presents easy to interpret graphical visualizations and numerical analyses that explain performance behaviour and issues, as they occur and change in continuous operations, as well as providing information on what to do to increase performance. Information from across the plant can be centralized and accessed from any display supporting a web browser. 

Features

  • Supervisory visualization and analysis across the facility, shown by line, shift and time period
  • Throughput, efficiency and yield cause/effect display and drill-down
  • Quantitative linkage of observed IV variations to actual upstream process variations 
  • Intuitive visual dashboards and tools
  • Uses IV data alone or in combination with other measurements
  • SPC charts for all data

Benefits:

  • Increased yield for PERC and other high-efficiency cell manufacturing yield
  • Higher average cell efficiency due to reduced unwanted variation in cell production
  • Deeper and more “actionable” information than currently available from traditional SPC tools
  • Faster, more accurate line ramp-up, optimization and troubleshooting
  • Reliability, speed and confidence in scaling operations while meeting or exceeding yield targets
  • Rapid, accurate detection and root-cause resolution of variations or problems in IV results
  • Industry 4.0 compliant
  • Payback by boosting yield without added complexity or tool upgrades/additions

Specifications:

HMI  2U rack mount computer with mouse/keyboard and external monitor
Network Interfaces 2 x Gigabit Ethernet with TCP/IP
Dimensions (computer) 482 mm x 88 mm x 480 mm
Mass (computer) 11.7 kg
Operating Temperature 0 – 40° C
Operating Humidity 10 – 85% @ 40° C RHNC*
Power Interface  50/60 Hz, 100-250 VAC
Power Consumption (max) 400 W  (computer only)
Remote Maintenance Interface  Available